Sciences, Technology & Medicine
Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation
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Product Description
By Xia, Fangzhou, Rangelow, Ivo W., Youcef-Toumi, Kamal. Published by Springer International Publishing AG. Format: Hardcover. Edition: 1st ed. 2024. 366 pages. Language: english. Published: 2024-02-07.
Book Specifications
| ISBN-13 | 9783031442322 |
| ISBN-10 | 3031442326 |
| Publisher | Springer International Publishing AG |
| Language | english |
| Print Length | 366 pages |
| Category | Sciences, Technology & Medicine |
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