Sciences, Technology & Medicine
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
By Newbury, Dale E., Fiori, Charles E., Joy, David C., Goldstein, Joseph I., Echlin, PatrickSpringer Verlag
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Product Description
By Newbury, Dale E., Fiori, Charles E., Joy, David C., Goldstein, Joseph I., Echlin, Patrick. Published by Springer Verlag. Format: Paperback. Edition: Reprint. 454 pages. Language: english. Published: 2013-06-08.
Book Specifications
| ISBN-13 | 9781475790290 |
| ISBN-10 | 1475790295 |
| Publisher | Springer Verlag |
| Language | english |
| Print Length | 454 pages |
| Category | Sciences, Technology & Medicine |
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