
Atom Probe Tomography: The Local Electrode Atom Probe
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Product Description
"Atom-Probe Tomography: The Local Electrode Atom Probe" by Michael K. Miller, Richard G. Forbes (auth.), published by Springer. Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography. Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe – a new state-of-the-art instrument – is also provided, along with detailed descriptions and limitations of laser pulsing as a method to field evaporate atoms. Valuable coverage of the new ionization theory is also included, which underpins the overall technique. Book details: 423 pages, published 2014. Order now on BookShops.in with fast, reliable delivery across India.
Book Specifications
| ISBN-13 | 9781489974303 |
| ISBN-10 | 148997430X |
| Publisher | Not Avail |
| Language | english |
| Print Length | 437 pages |
| Category | Higher Education Textbooks |
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