Focused Ion Beam Systems (English, Nan Yao)-66% OFF
Cambridge University Press

Focused Ion Beam Systems (English, Nan Yao)

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Book Details

ISBN-139780521831994
ISBN-100521831997

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About the Book

The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume, first published in 2007, comprehensively covers t…

ISBN: 9780521831994

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