Sciences, Technology & Medicine
Nonlinear Transistor Model Parameter Extraction Techniques (English, Matthias Rudolph | Christian Fager | David E. Root)
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Book Details
| ISBN-13 | 9780521762106 |
| ISBN-10 | 0521762103 |
Product Description
About the Book
Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects. Learn how similar approaches to parameter extraction can be applied…
ISBN: 9780521762106
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