Cambridge University Press
Reflection Electron Microscopy and Spectroscopy for Surface Analysis (English, Zhong Lin Wang)
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Book Details
| ISBN-13 | 9780521482660 |
| ISBN-10 | 0521482666 |
Product Description
About the Book
This book is a comprehensive review of the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS). The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials sc…
ISBN: 9780521482660
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