Reference
Semiconductor Material And Device Characterization (IEEE Press)
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Product Description
"Semiconductor Material And Device Characterization (IEEE Press)" by Schroder, Dieter K., published by IEEE. This title falls under Reference, making it a solid pick for readers interested in the subject. Book details: 779 pages, published 2006-01-11. Order now on BookShops.in with fast, reliable delivery across India.
Book Specifications
| ISBN-13 | 9780471739067 |
| ISBN-10 | 0471739065 |
| Publisher | IEEE |
| Language | english |
| Print Length | 779 pages |
| Category | Reference |
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