Power-Constrained Testing of VLSI Circuits (English, Nicola Nicolici | Bashir M. Al-Hashimi)

Name: Power-Constrained Testing of VLSI Circuits (English, Nicola Nicolici | Bashir M. Al-Hashimi)
SKU: isbn-9781402072352
Price: 5329.00 INR
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ISBN: 9781402072352

By Nicola Nicolici | Bashir M. Al-HashimiSpringer

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About the Book

Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While many techniques have investigated power minimization during the functional (normal) mode of operation, it is important to examine the power dissipation during the test circuit activity is substantially higher during test than during functional operation. For example, during the execution of built-i…

ISBN: 9781402072352

Book Specifications

ISBN-13	9781402072352
ISBN-10	140207235X
Publisher	Springer
Category	Springer

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