Computers & Internet
Testing Static Random Access Memories: Defects, Fault Models and Test Patterns: 26 (Frontiers in Electronic Testing)
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Product Description
By Hamdioui, Said. Published by Springer Nature. Format: Paperback. Edition: Softcover Reprint of the Original 1st 2004 ed.. 240 pages. Language: english. Published: 2010-12-09.
Book Specifications
| ISBN-13 | 9781441954305 |
| ISBN-10 | 1441954309 |
| Publisher | Springer Nature |
| Language | english |
| Print Length | 240 pages |
| Category | Computers & Internet |
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