
X-Ray Scattering Fr Semiconductors(2ed) (English, Fewster Paul F)
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Product Description
About the Book
This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information…
ISBN: 9781860943607
Book Specifications
| ISBN-13 | 9781860943607 |
| ISBN-10 | 1860943608 |
| Publisher | Imperial College Press |
| Category | Imperial College Press |
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