Monte Carlo Modeling for Electron Microscopy and Microanalysis (English, David C. Joy)
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About the Book
This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid. Optimized for use o…
ISBN: 9780195088748
Book Specifications
| ISBN-13 | 9780195088748 |
| ISBN-10 | 0195088743 |
| Publisher | Oxford University Press |
| Category | Oxford University Press |
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